Yeast Initiation Factor 4A

(All numbering and residues are taken from first PDB file)

Bending Residue Dihedral Analysis

Residue i Residue i+1 Distance of hinge axis to residue i in conformer 1 (A) Distance of hinge axis to residue i in conformer 2 (A) Change in psi (i) (deg) Change in phi (i+1) (deg) Angle of psi(i) axis to hinge axis conformer 1 (deg) Angle of psi(i) axis to hinge axis conformer 2 (deg) Percentage Progress  ARG-220   ILE-221  4.1 3.9 -7.3 -4.0 111.6 109.1 -5.1  ILE-221   LEU-222  1.8 1.9 34.8 -11.3 12.0 2.2 21.3  LEU-222   VAL-223  1.4 1.0 -50.1 -6.7 125.0 108.8 -29.9  VAL-223   LYS-224  0.9 4.0 -20.7 -23.9 102.9 167.0 -27.2  LYS-224   LYS-225  4.6 4.1 -157.9 -116.9 148.8 118.8 82.8  LYS-225   ASP-226  5.1 6.3 -83.4 127.3 91.6 97.2 22.6  ASP-226   GLU-227  8.5 9.5 -47.0 51.5 136.3 160.4 4.9  GLU-227   LEU-228  10.7 10.3 -36.5 -28.1 141.6 114.1 -49.4  LEU-228   THR-229  12.6 12.6 -116.9 141.6 76.4 108.9 16.4  THR-229   LEU-230  16.3 15.9 52.1 28.4 43.2 58.4 60.3 Graph shows rotational transition at bending residues and can be used to identify hinge bending residues. Probably only informative for interdomain rotations greater than 20 degrees